The Synchrotron Radiation Source provides high intensity, continuously tuneable, photon beam and has emerged as a boon to Materials Research. One may do Small angle X ray Scattering, X- Ray absorption fine structure, and angle- integrated and angle-resolved photoelectron spectroscopy with a great saving in time. In India the RRCAT has built two synchrotron sources INDUS 1 and INDUS 2 in Indore, with a variety of beamlines.
Facilities to produce accelerated heavy ion beams have been set up in several laboratories in India. These ion beams can be used in Particle Induced X ray Emission, Rutherford Back Scattering, Nuclear Reaction Analysis and Elastic Recoil Detection to analyse the composition of materials near the surface.
Accelerated electron beams are used commercially in materials processing. Ion implantation is a well-known process for introducing dopant atoms at a required dosage and depth in semiconductor materials, in surface hardening of tools etc. Swift heavy ion beams produce modifications in material properties.
In this book all the above topics are discussed explaining the basic principles involved in the processes and giving appropriate examples. The book will be useful for students of Physics and Materials Science at the Master’s degree and Doctoral levels.